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Author: Firma TOPTICA Photonics

High-Speed Terahertz System for Industrial Quality Control

Posted on 27. February 2020 by Firma TOPTICA Photonics Posted in General Tagged coatings, Inline Measurements, Material Inspection, Non-destructive testing, terahertz, Thickness Gauging

Measurement speed becomes particularly relevant if the task involves rapidly moving samples, e.g., thickness gauging in extrusion lines, or items on fast conveyor belts that may need to be screened with single-millimeter resolution. In contrast to conventional terahertz time-domain spectrometers, […]

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DFC CORE +: Compact high-performance frequency comb

Posted on 14. February 202014. February 2020 by Firma TOPTICA Photonics Posted in General Tagged CEP-stable Seeders, Direct Frequency Comb Spectroscopy, Dual-comb Spectroscopy, High-resolution Spectroscopy, interferometry, Laser Reference, Microwave Generation, Optical Clocks, Quantum Computing, Transportable AMO Systems

Frequency combs are used to measure absolute optical frequencies and to stabilize cw-lasers to specific frequencies, for example in order to drive transitions in cold atomic samples. Stabilization of Tunable Diode Lasers to a frequency comb is a reliable way […]

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