Firma OWIS, Autor bei PR-Web

OWIS Positioniersysteme in der digital-holographischen 3D-Messtechnik

Posted on 19. September 202419. September 2024 by Firma OWIS Posted in General Tagged 3D Messtechnik, digital-holographisch, Direktangetriebene Linearachsen, fraunhofer ipm, hohe Präzision, ipm, linpos, Oberflächenbeleuchtung, optische laser, optische Messung, owis, Photographie, Positioniersysteme, Produktion, technologie

Im Gegensatz zur Fotographie, bei der die räumliche Verteilung der Lichtintensität gespeichert wird, nutzt die Holographie zusätzlich die Aufzeichnung der Phaseninformation. Voraussetzung hierfür ist eine kohärente Lichtquelle – typischerweise ein oder mehrere Laser. Wird die Oberfläche eines Bauteils mit Laserlicht […]

OWIS positioning systems in digital-holographic 3D measurement technology

Posted on 19. September 202419. September 2024 by Firma OWIS Posted in General Tagged 3d measurement, digital-holographic, direct-drive linear stages, fraunhofer, high precision, ipm, linpos, optical measurement, owis, photography, positioning systems, production, surface inspection

In contrast to photography, in which the spatial distribution of light intensity is stored, holography also uses the recording of phase information. The prerequisite for this is a coherent light source – typically one or more lasers. If the surface […]

Dr. Dominik Zimmermann becomes authorized signatory and Chief Business Development Officer (CBDO) at OWIS

Posted on 28. February 2024 by Firma OWIS Posted in General Tagged cbdo at owis, engeneering, high-precision positioning systems, microsystems, optical components, owis, owis engeneering, semiconductor technology, specially developed oem solutions, staufen, technology, zimmermann

With effect from February 1, 2024, Dr. Dominik Zimmermann has been granted power of attorney and appointed Chief Business Development Officer (CBDO). In his new role, Zimmermann will continue to be responsible for the OWIS Engineering division and, together with […]

Positioning stages with direct drive

Posted on 18. December 202319. December 2023 by Firma OWIS Posted in General Tagged direct drive, laser processing, linear stage, measuring system, motorized, owis, positioner, positioning stages, precision measurement, rotary stages, scanning applications, Semiconductor Manufacturing

We have added a new generation of linear and rotary stages with direct drive to our range of motorized positioners. Discover the 6 advantagesKlicken, um Alternative zu verwenden. They combine six advantages: Fast: constant speed up to 950 mm/s Dynamic: acceleration up […]

Successful hygiene of a washing process

Posted on 13. January 202214. January 2022 by Firma OWIS Posted in General Tagged Fluorescence, lense, optics, owis, Photonics, rails, slides, spectroscopy

The fluorescence spectroscopy uses fluorescence phenomena for the analysis of substances. It differs from several other spectroscopies as it measures the emission instead of the absorption of fluorescent radiation. The research institute „wfk – Cleaning Technology Institute e.V.“ in Krefeld, […]

Plus with system

Posted on 26. October 202126. October 2021 by Firma OWIS Posted in General Tagged additive manufacturing, analytics, biotechnology, diagnostics, image processing, laser processing, measurement technology, medical technology, Photonics, Semiconductors, sensor technology, testing technology

Unlock enormous potential with OWIS Engineering OWIS develops and produces optical beam handling and positioning systems. Linear axes and XY stages, goniometers, beam handling systems, optical components – the variety and combinability makes the OWIS product portfolio the perfect modular […]

OWIS with new owner

Posted on 29. January 2021 by Firma OWIS Posted in General Tagged company takeover, laser, owis, staufen, vacuum

The company OWIS from Staufen im Breisgau (Germany), a specialist in optical beam handling and positioning systems, settled its corporate succession. The previous managing director and shareholder Ruediger Ruh will take over the company with effect from January 1, 2021. […]

FXE Instrument at European XFEL in Germany

Posted on 3. February 2020 by Firma OWIS Posted in General Tagged actuator, Crystal, diffraction crystals, femtosecond, mms 19, MMS 19 actuator, von Hamos emissions spectrometer, x-ray, X-ray emissions spectrometer, X-ray emissions spectrum, xfel

Femtosecond spectroscopy with X-rays is one of the tasks of the European XFEL, the 3.4 km long X-ray laser located in the Hamburg area. The FXE Group (Femtosecond X-Ray Experiments) carries out time-resolved studies on the dynamics of solid objects, […]