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Author: Firma Park Systems Europe

Fraunhofer IMWS and Park Systems invite for International Symposium on Failure Analysis and Material Testing – FAMT 2021, July 1

Posted on 29. March 202130. March 2021 by Firma Park Systems Europe Posted in Events Tagged afm, electronics, Failure Analysis, fraunhofer, material testing, research, semiconductor, Semiconductors, symposium

Fraunhofer Institute for Microstructure of Materials and Systems IMWS and Park Systems are inviting for International Symposium on Failure Analysis and Material Testing – FAMT 2021 (in a virtual format). The symposium gathers the professionals from the electronic industry to […]

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International Symposium on Failure Analysis and Material Testing – FAMT 2021 (Konferenz | Online)

Posted on 29. March 2021 by Firma Park Systems Europe Posted in Events

Advancing miniaturization shapes our modern, high-tech world. The design complexity of electronic components and the heterogeneity of new materials constantly increase with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet […]

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Helmholtz Zentrum Berlin and Park Systems Start a Research Collaboration in Materials Science

Posted on 20. October 2020 by Firma Park Systems Europe Posted in Research / Development Tagged afm, Collaboration, cooperation, energy, helmholtz, hzb, Material Science, metrology, nano, nanotechnology, research, solutions, spm

Park Systems, a leading manufacturer of Atomic Force Microscopes (AFM) and the Helmholtz Zentrum Berlin (HZB), an internationally renowned and recognized research center in the field of materials for a sustainable energy supply, have signed an agreement providing a framework […]

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Park Systems Introduces Park NX-Tip Scan Head – The Automated Atomic Force Microscopy System for measuring Ultra Large and Heavy Flat Panel Displays

Posted on 3. August 2020 by Firma Park Systems Europe Posted in Research / Development Tagged afm, atomic force microscopy, flat panel displays, large sample analysis, LCD, metrology, nanoscale, oled, photomasks, Product launch, Tip Scanning Head

To answer the increasing demand for AFM based metrology on larger flat panel displays, Park Systems has introduced the NX-Tip Scan Head, which overcomes nanometrology challenges for sample dimensions over 300mm and weights above 1kg. The Tip Scanning Head (TSH) […]

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Park Systems, world-leading innovator in Atomic Force Microscopy, opens a NEW PARK SYSTEMS UK OFFICE in Nottingham, United Kingdom

Posted on 8. June 2020 by Firma Park Systems Europe Posted in General Tagged afm, expansion, nanoscience, nanoscientific, nanotechnology, nx20, research, spm, united kingdom

Park Systems, a world-leading innovator in atomic force microscopy (AFM), proudly announces the opening of a new European subsidiary in Nottingham, United Kingdom. For well over a decade, Park Systems continuously strengthens its innovative role in the nanoscale microscopy and […]

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2020 NanoScientific Forum Europe on Scanning Probe Microscopy (SPM) goes VIRTUAL! Same program! Same date!

Posted on 28. May 202028. May 2020 by Firma Park Systems Europe Posted in Events Tagged SPM AFM nanoscience researchbyspm EnergyStorage Nanophotonics Nanoelectronics Organic inorganic hybrid Semiconductors Nanomater

In face of the uncertain situation in Europe, the NSFE committee has decided to hold this year’s NSFE 2020 in a virtual form, giving the priority to secure the safety of our NSFE community. The forum remains hosted by Prof. […]

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Park Systems Completes Equity Investment in Molecular Vista

Posted on 12. May 202013. May 2020 by Firma Park Systems Europe Posted in General Tagged afm, chemical analysis, company, equity, industry, infrared, IR, microscopy, nano, photoTHERMAL, PiFM, spm, technology

Park Systems Corp. world-leading manufacturer of Atomic Force Microscopes (AFM), announced today it has made an equity investment in Molecular Vista, based in San Jose, USA. Molecular Vista produces AFM tools to probe and understand matter at the molecular level through […]

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ELECTRIFIED BY Atomic Force Microscopy! – Virtual Journey from Research to Industry

Posted on 20. April 202020. April 2020 by Firma Park Systems Europe Posted in Research / Development Tagged afm, atomic, automation, livedemo, mfm, nanoscale, nanoscience, nanotechnology, pfm, repeatability, research, SCM, semiconductor, spm, webinar

Get yourself electrified by Atomic Force Microscopy (AFM)” offers online AFM courses from Research to Industry Applications! In the face of these challenging times, to maintain a daily work routine at every research and engineering lab, Park Systems introduces a […]

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imec and Park Systems sign the 2nd JDP to Increase the Strategic Investment in Developing Nano-Metrology Solutions for Semiconductor Manufacturing

Posted on 23. March 2020 by Firma Park Systems Europe Posted in Research / Development Tagged 3D assembly stacking, 3d metrology, afm, imec, JDP, nanoelectronics, nanometrology, research, semiconductor, Semiconductor Manufacturing, wafer semiconductor

Park Systems, the global leader and innovator of Atomic Force Microscopy and Metrology solutions, and imec, world-leading R&D and innovation hub in nanoelectronics and digital technologies, have signed the 2nd Joint Development Project (JDP) within 4 years to increase the […]

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NanoScientific Forum Europe on Scanning Probe Microscopy (SPM) Research to be held on September 23-25, 2020 at Trinity College Dublin, Ireland

Posted on 18. March 202018. March 2020 by Firma Park Systems Europe Posted in Events Tagged afm, energy storage, inorganic and hybrid Semiconductors, LIFE SCIENCE, Material Science, Nanocharacterization, Nanomaterials and Biotechnology, Nanophotonics and Nanoelectronics, nanoscience, nanotechnology, organic, Polymer Science, researchbyspm, spm

After the successful first and second editions in Germany and Italy, the 3rd NanoScientific Forum Europe (NSFE 2020) invites scientists and researchers working in the field of Scanning Probe Microscopy to magnificent Dublin! The scientific focus lies on energy storage and […]

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